Matlab scripts to extract timestamps from CoMPASS data and calculate die-away time, S, D, T

Folder contents:

.
├── readme.md: This file.
├── WaveBinFile.m: Matlab script to parse binary file saved by CoMPASS.
├── extractTimeStamp.m: Extract timestamps from binary data.
├── getRossiAlpha.m: Calculate Rossi-alpha distribution and perform exponential fit to extract the die-away time. 
├── getSDT.m: Matlab script to calculate Singles, Doubles, Triples count rates and their associated uncertainties using a signal-trigger shift register algorithm. Multiplicity > 20 will be printed and rejected.
├── testdata
│   │   ├── analog
│   │   │   └── DataR_CH*@DT5730_1770_ananlog_100MB.BIN: Data acquired from anaglog channel in a Cf-252 measurement. Truncated to reduce size to 100MB.
|   |   ├── ttl
│   │   │   └── DataR_CH*@DT5730_1770_ttl_100MB.BIN:     Data acquired from ttl channel in a Cf-252 measurement. Truncated to reduce size to 100MB.
├── LMFsolve: external library for performing non-linear least-square fit.
└── unittest: scripts and data for unit testing.

Dependencies

No Matalab Toolbox is needed.

How to run the test:

1. Run extractTimeStamp.m A mat file mergedtimestamps.mat is generated in folder output_matlab/analog.
2. Run getRossiAlpha.m The Rossi-alpha plot and the fit show up on your screen. The die-away time found through data-fitting is 22.3 us.
3. Run getSDT.m The S,D,T count rates and their associated uncertainties are printed, as shown below:

       Single (cps): 1798.4315, sigma_s (cps): 2.2768
       Double (cps): 260.0158, sigma_D (cps): 1.2486
       Triple (cps): 21.2912, sigma_T (cps): 0.62511

Change the input section of each script when applying them to process data from new measurements. Run the scripts in the same order as in the test.

How to run the unittest (not required):

1. Move TestBinParserV1.m and TestBinParserV2.m to the outer directory. Run runtests in matlab and the following output should be printed:

       Totals:
       8 Passed, 0 Failed, 0 Incomplete.
       1.3037 seconds testing time.